Four-axes stage for low-noise AFM CD measurements | Discover how nanotools CDR30-EBD https://www.nanotools.com/products/blue-line/cdr-ebd/cdr30-ebd.html and High Aspect Ratio (HAR)... | By nanotoolsFacebook
![Principle of CD-AFM (a) and tilting-AFM (b) applied in the measurement. | Download Scientific Diagram Principle of CD-AFM (a) and tilting-AFM (b) applied in the measurement. | Download Scientific Diagram](https://www.researchgate.net/publication/260559147/figure/fig1/AS:11431281211859192@1702501332285/Principle-of-CD-AFM-a-and-tilting-AFM-b-applied-in-the-measurement.jpg)
Principle of CD-AFM (a) and tilting-AFM (b) applied in the measurement. | Download Scientific Diagram
![AFM image of CD templated PDMS resulting only micro roughness (buckles)... | Download Scientific Diagram AFM image of CD templated PDMS resulting only micro roughness (buckles)... | Download Scientific Diagram](https://www.researchgate.net/publication/280696552/figure/fig5/AS:284498165026829@1444841056954/AFM-image-of-CD-templated-PDMS-resulting-only-micro-roughness-buckles-a-as-prepared.png)
AFM image of CD templated PDMS resulting only micro roughness (buckles)... | Download Scientific Diagram
![17. CD AFM measurements of resist ( top ), hard mask ( middle ), and... | Download Scientific Diagram 17. CD AFM measurements of resist ( top ), hard mask ( middle ), and... | Download Scientific Diagram](https://www.researchgate.net/publication/251149130/figure/fig11/AS:298163169710083@1448099047200/CD-AFM-measurements-of-resist-top-hard-mask-middle-and-reference-standard.png)